2017 Advanced Course of Ceramic Thin Film Technology

Font size  SML

Register update notification mail Add to favorite lecture list
Academic unit or major
Graduate major in Materials Science and Engineering
Instructor(s)
Shinozaki Kazuo  Wakiya Naoki  Sakamoto Naonori 
Class Format
Lecture     
Media-enhanced courses
Day/Period(Room No.)
Mon3-4(S7-201, ※7/17(月)以降はS224)  Thr3-4(S7-201, ※7/17(月)以降はS224)  
Group
-
Course number
MAT.C403
Credits
2
Academic year
2017
Offered quarter
2Q
Syllabus updated
2017/3/17
Lecture notes updated
2017/7/28
Language used
Japanese
Access Index

Lecture

Lecture 1 Course outline. Introduction of thin film technologies (I)

2017.6.12(Mon.) 3-4Session

Lecture

Lecture 2 Introduction of thin film technologies (II)

2017.6.15(Thu.) 3-4Session

Lecture

Lecture 3 Basics of thin film growth (I)

2017.6.19(Mon.) 3-4Session

Lecture

Lecture 4 Basics of thin film growth (II)

2017.6.22(Thu.) 3-4Session

Lecture

Lecture 5 Basics of thin film growth (III)

2017.6.26(Mon.) 3-4Session

Lecture

Lecture 6 Basics of thin film growth (IV)

2017.6.29(Thu.) 3-4Session

Lecture

Lecture 7 Oxide thin film growth by PVD method and their application

2017.7.3(Mon.) 3-4Session

Lecture

Lecture 8 Oxide thin film growth by CVD method and their application

2017.7.6(Thu.) 3-4Session

Lecture

Lecture 9 Application of thin film: thin film coating for engineering field application

2017.7.10(Mon.) 3-4Session

Lecture

Lecture 10 Characterization technology (I): Fundamentals of X-ray diffraction method and its application for characterization of thin film structure

2017.7.13(Thu.) 3-4Session

Lecture

Lecture 11 Characterization technology (III): molecular vibration and calculation of lattice vibration

2017.7.17(Mon.) 3-4Session

Lecture

Lecture 12 Characterization technology (I): Fundamentals of transmission electron microscopy and its application for characterization of thin film structure

2017.7.20(Thu.) 3-4Session

Lecture

Lecture 13 Characterization technology (IV): measurement of lattice vibration in thin film

2017.7.24(Mon.) 3-4Session

Lecture

Lecture 14 Characterization technology (V): basics of scanning probe microscope and its application to thin film

2017.7.27(Thu.) 3-4Session

Lecture

Lecture 15 Characterization technology (VI): electrical properties of thin film and measurement methods

2017.7.31(Mon.) 3-4Session

Lecture

Lecture 16 final exam

2017.8.3(Thu.) 3-4Session

Get Adobe Reader

It is necessary for those who refer to the PDF file to use "Adobe Reader" as the plug-in software of Adobe System Company.
If you don't have the software, please download from this item (free).

Creative Commons License