2017 Advanced Course of Instrumental Analysis for Materials

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Academic unit or major
Graduate major in Materials Science and Engineering
Instructor(s)
Yano Tetsuji  Fukunaga Keiichi  Matsushima Hideki  Sato Takaya  Onodera Hiroshi  Mori Norihisa  Tsutsumi Kenichi  Shima Masahide  Utsumi Hiroaki  Nakai Yumi  Sato Tomoshige  Arii Tadashi  Asahina Shunsuke 
Course component(s)
Lecture
Mode of instruction
 
Day/Period(Room No.)
Tue7-8(S7-201)  Fri7-8(S7-201)  
Group
-
Course number
MAT.C405
Credits
2
Academic year
2017
Offered quarter
3Q
Syllabus updated
2017/3/17
Lecture notes updated
-
Language used
Japanese
Access Index

Course description and aims

Various kinds of the instrumental analysis techniques have been utilized for the evaluation and analysis of materials. In this lecture, indispensable analysis techniques are explained from their fundamental principles to their application to the latest materials science.

Student learning outcomes

Understand the principle and application of lectured instrument analysis techniques.

Keywords

TEM,SEM,EPMA,SAM,XPS,FIB,NMR,ESR,XRF,XRD,thermal analysis

Competencies that will be developed

Specialist skills Intercultural skills Communication skills Critical thinking skills Practical and/or problem-solving skills

Class flow

In every lectures, different types of the instrument analysis techniques are lectured from the principle of analysis to the application to the materials science. The students recieve the documents of the respective analysis technique, and use then to understand the explanatiuon by lecturors.

Course schedule/Required learning

  Course schedule Required learning
Class 1 Principle and application of transmission electron microscope(TEM) The students understand the principle and application of transmission electron microscope(TEM).
Class 2 Principle and application of scanning electron microscope(SEM) The students understand the principle and application of scanning electron microscope(SEM).
Class 3 Principle and application of electron probe microanalysis(EPMA) The students understand the principle and application of electron probe microanalysis(EPMA).
Class 4 Principle and application of Auger electron microscope(SAM) The students understand the principle and application of Auger electron microscope(SAM).
Class 5 Principle and application of X-ray photoelectron spectroscopy(XPS) The students understand the principle and application of X-ray photoelectron spectroscopy(XPS).
Class 6 Principle and application of focused ion beam (FIB) The students understand the principle and application of focused ion beam (FIB).
Class 7 Principle and application of nuclear magnetic resonance spectroscopy(NMR) The students understand the principle and application of nuclear magnetic resonance spectroscopy(NMR).
Class 8 Principle and application of electron spin resonance spectroscopy(ESR) The students understand the principle and application of electron spin resonance spectroscopy(ESR).
Class 9 Principle and application of mass spectroscopy(MS) The students understand the principle and application of mass spectroscopy(MS).
Class 10 Principle and application of X-ray fluorescence spectroscopy(XRF) The students understand the principle and application of X-ray fluorescence spectroscopy(XRF).
Class 11 Principle and application of scanning probe microscope(SPM) The students understand the principle and application of scanning probe microscope(SPM).
Class 12 Principle and application of X-ray diffraction analysis(XRD) The students understand the principle and application of X-ray diffraction analysis(XRD).
Class 13 Principle and application of thermal analysis techniques The students understand the principle and application of thermal analysis techniques.
Class 14 Presentation and discussion 1 Presentation of recent instrument analysis progress picked up from the literatures by each student
Class 15 Presentation and discussion 2 Presentation of recent instrument analysis progress picked up from the literatures by each student

Textbook(s)

not specified.
Printed documents are provided for each lecture.

Reference books, course materials, etc.

not specified

Assessment criteria and methods

Achievement is evaluated by the percentage of attendance, reports and presentations.

Related courses

  • MAT.C302 : Spectroscopy

Prerequisites (i.e., required knowledge, skills, courses, etc.)

not specified

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