2019 Applied Diffraction Crystallography in Metals and Alloys

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Academic unit or major
Graduate major in Materials Science and Engineering
Instructor(s)
Nakamura Yoshio  Fujii Toshiyuki 
Course component(s)
Lecture
Day/Period(Room No.)
Mon5-6(S8-501)  Thr5-6(S8-501)  
Group
-
Course number
MAT.M401
Credits
2
Academic year
2019
Offered quarter
2Q
Syllabus updated
2019/3/18
Lecture notes updated
-
Language used
English
Access Index

Course description and aims

X-ray diffraction and electron diffraction are extremely effective methods for conducting structural analysis of crystalline materials. In this course students study kinematic theory and dynamical theory, and learn through exercises the principles and specific techniques of orientation analysis and structural analysis using X-ray diffraction.
By gaining an understanding of the special characteristics of X-ray and electron diffraction, students will learn to carry out material characterization with the most suitable technique.

Student learning outcomes

At the end of this course, students will be able to:
1) Have and understanding of the principles of x-ray and electron diffraction.
2) Explain the differences between x-ray and electron diffraction.
3) Acquire the techniques and skills of materials characterization.

Keywords

space group, x-ray diffraction, back-reflection Laue method, electron diffraction, diffraction condition, kinematical theory of electron diffraction, dynamical theory of electron diffraction, structure analysis, electron microscope, electron diffraction pattern

Competencies that will be developed

Intercultural skills Communication skills Specialist skills Critical thinking skills Practical and/or problem-solving skills
- - -

Class flow

Attendance is taken in every class.
Towards the end of class, students are given exercise problems related to what is taught on that day to solve.

Course schedule/Required learning

  Course schedule Required learning
Class 1 Symmetry of crystals The homework must be handed in next class.
Class 2 Stereographic projection and orientation relationship
Class 3 X-ray diffraction and back-reflection Laue method
Class 4 Crystal orientation analysis by x-ray diffraction
Class 5 Kinematical theory of electron diffraction
Class 6 Laue condition
Class 7 Electron diffraction pattern
Class 8 Achievement evaluation and general practice (1)
Class 9 Dynamical theory of electron diffraction
Class 10 Structure analysis by x-ray and electron diffraction methods
Class 11 Influence of structural imperfections on the diffraction pattern
Class 12 Difference between x-ray diffraction and electron diffraction
Class 13 Principles of electron microscope
Class 14 Images of electron microscopy
Class 15 Achievement evaluation and general practice (2)

Textbook(s)

Course materials are provided during class.

Reference books, course materials, etc.

B.D. Cullity and S. R. Stock,"Elements of x-ray diffraction", third edition, PrenticeHall, (2001).
L. Reimer, "Transmission electron microscopy", fourth edition, Springer-Verlag, (1997).
B. Fultz and J. M. Howe, "Transmission electron microscopy and diffractometry of materials", second edition, Springer-Verlag, (2002).

Assessment criteria and methods

Students’ course scores are based on exercise problems and midterm exams (50%) and final exams (50%).

Related courses

  • MAT.M201 : Fundamentals of Crystallography

Prerequisites (i.e., required knowledge, skills, courses, etc.)

No prerequisites are necessary, but enrollment in the related courses is desirable.

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