- 開講元
- 材料コース
- 担当教員名
- CHAI YAW WANG
- 授業形態
- 講義
- メディア利用科目
- 曜日・時限(講義室)
- 月1-2(J234) 木1-2(J234)
- クラス
- -
- 科目コード
- MAT.M419
- 単位数
- 2
- 開講年度
- 2016年度
- 開講クォーター
- 4Q
- シラバス更新日
- 2016年9月14日
- 講義資料更新日
- -
- 使用言語
- 英語
- アクセスランキング
-
media
講義の概要とねらい
This course provides a comprehensive introduction to a range of microscopy techniques (viz. Optical and electron microscopies). The syllabus includes brief introduction to the structure of crystalline solids, imperfections in solid materials and basic concepts of microscopy. Students will explore the main construction and basic principles of various microscopy techniques, the strengths and weaknesses of each technique, and be better planned of selecting a suitable microscopy technique for their research purpose. Other topics include basics of optical properties, electron-solid interactions, electron diffraction and image formation, and discussion of different techniques of specimen preparations. Electron diffraction analyses and X-ray energy-dispersive spectrometry for microstructure characterization, phase identification and crystallography analyses of a wide spectrum of solid materials. A brief introduction to the very recent development of advanced aberration corrected scanning transmission electron microscopy for imaging and spectrometry at atomic resolution.
到達目標
By the end of this course, students will be able to:
(a) Understand the basic construction, capabilities and limitations of each microscopic technique.
(b) Understand the different modes of image formation in each microscopic technique for microstructure and crystallographic characterization in solid materials.
キーワード
Optical and electron microscopies, nanostructure, microstructure, crystallography, properties, solid materials
学生が身につける力(ディグリー・ポリシー)
| ✔ 専門力 | 教養力 | ✔ コミュニケーション力 | 展開力(探究力又は設定力) | 展開力(実践力又は解決力) |
授業の進め方
Quiz and exercises may be given in lectures to improve understanding.
授業計画・課題
| 授業計画 | 課題 | |
|---|---|---|
| 第1回 | Introduction | Historical and current developments of microscopy in materials science. |
| 第2回 | Structure of crystalline solids | Brief introduction to the concepts of lattice, basis and crystal structure systems. |
| 第3回 | Imperfections in solid materials | Introduction to various types of defects in solid materials |
| 第4回 | Optical microscopy | Basic structure and principles of optical microscopy, properties of light, image formation, magnification and resolution. |
| 第5回 | Scanning electron microscopy (SEM)-I | Electron beam-specimen interactions. |
| 第6回 | Scanning electron microscopy (SEM)-II | Instrumentation and image formation. |
| 第7回 | Electron Probe Micro Analyzer (EPMA) | Basic principles and X-ray microanalysis. |
| 第8回 | Specimen preparation | Introduction to various specimen preparation methods for optical microscopy, SEM and EPMA. |
| 第9回 | Transmission Electron microscopy (TEM)-I | Introduction to the different components and their functions of a TEM microscope. |
| 第10回 | Transmission Electron microscopy (TEM)-II | Electron diffraction, Bragg’s Law and thinking in reciprocal space. |
| 第11回 | Transmission Electron microscopy (TEM)-III | Principle of each imaging mode and indexing diffraction pattern. |
| 第12回 | High Resolution Transmission Electron Microscopy (HRTEM) | Brief introduction to the principles of lattice image formation. |
| 第13回 | Scanning Transmission Electron Microscopy (STEM) | Introduction to the basic principles of STEM. |
| 第14回 | Specimen preparation for TEM. | Introduction to various techniques of TEM specimen preparation in solid materials. |
| 第15回 | Review | Case studies: Learning from the microstructure in the development of thermoelectric half-Heusler alloys. |
教科書
1) William D. Callister, Jr. and David G. Rethwisch, Materials Science and Engineering: An Introduction, (Wiley, 2014, 9th edition)
2) Joseph I. Goldstein, Dale E. Newbury, Patrick Echlin, David C. Joy, Charles Fiori and Eric Lifshin, Scanning Electron Microscopy and X-ray Microanalysis-A Text for Biologists, Materials Scientists and Geologists, (Plenum Press, New York, 1981).
3) David B. Williams and C. Barry Carter, Transmission Electron Microscopy- A Textbook for Materials Science, (Plenum Press, New York, 1996).
参考書、講義資料等
1) Nobuo Tanaka, Ed., Scanning Transmission Electron Microscopy of Nanomaterials- Basics of Imaging and Analysis, (Imperial College Press, 2015)
成績評価の基準及び方法
Students are assessed by mid- and final term examinations.
関連する科目
- MAT.M313 ： 材料科学入門
履修の条件(知識・技能・履修済科目等)
Some basic knowledge of crystallography and solid materials may be helpful.
連絡先（メール、電話番号） ※”[at]”を”@”(半角)に変換してください。
Suzukakedai, J2 building, 14th floor, Room 1413 (ext. 5578)
chai.y.aa[at]m.titech.ac.jp
オフィスアワー
9:00-18:00
