Various kinds of the instrumental analysis techniques have been utilized for the evaluation and analysis of materials. In this lecture, indispensable analysis techniques are explained from their fundamental principles to their application to the latest materials science.
Understand the principle and application of lectured instrument analysis techniques.
✔ Applicable | How instructors' work experience benefits the course |
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Lectures on each analytical device will be given by expert engineers who are in charge of research and development of each device in the analytical device manufacturers. |
TEM,SEM,EPMA,SAM,XPS,FIB,NMR,ESR,XRF,XRD,thermal analysis
✔ Specialist skills | Intercultural skills | Communication skills | Critical thinking skills | ✔ Practical and/or problem-solving skills |
In every lectures, different types of the instrument analysis techniques are lectured from the principle of analysis to the application to the materials science. The students recieve the documents of the respective analysis technique, and use then to understand the explanatiuon by lecturors.
Course schedule | Required learning | |
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Class 1 | Principle and application of electron spin resonance spectroscopy(ESR) | The students understand the principle and application of electron spin resonance spectroscopy(ESR). |
Class 2 | Principle and application of nuclear magnetic resonance spectroscopy(NMR) | The students understand the principle and application of nuclear magnetic resonance spectroscopy(NMR). |
Class 3 | Principle and application of mass spectroscopy(MS) | The students understand the principle and application of mass spectroscopy(MS). |
Class 4 | Principle and application of electron probe microanalysis(EPMA) | The students understand the principle and application of electron probe microanalysis(EPMA). |
Class 5 | Principle and application of X-ray photoelectron spectroscopy(XPS) | The students understand the principle and application of X-ray photoelectron spectroscopy(XPS). |
Class 6 | Principle and application of Scanning Auger electron microscope(SAM) | The students understand the principle and application of Scanning Auger electron microscope(SAM). |
Class 7 | Principle and application of scanning electron microscope(SEM) | The students understand the principle and application of scanning electron microscope(SEM). |
Class 8 | Principle and application of transmission electron microscope(TEM) | The students understand the principle and application of transmission electron microscope(TEM). |
Class 9 | Principle and application of focused ion beam (FIB) | The students understand the principle and application of focused ion beam (FIB). |
Class 10 | Principle and application of X-ray fluorescence spectroscopy(XRF) | The students understand the principle and application of X-ray fluorescence spectroscopy(XRF). |
Class 11 | Principle and application of thermal analysis techniques | The students understand the principle and application of thermal analysis techniques. |
Class 12 | Principle and application of X-ray diffraction analysis(XRD) | The students understand the principle and application of X-ray diffraction analysis(XRD). |
Class 13 | Presentation and discussion 1 | Presentation of recent instrument analysis progress picked up from the literatures by each student |
Class 14 | Presentation and discussion 2 | Presentation of recent instrument analysis progress picked up from the literatures by each student |
Class 15 | Presentation and discussion 3(preliminary date) |
To enhance effective learning, students are encouraged to spend approximately 100 minutes preparing for class and another 100 minutes reviewing class content afterwards (including assignments) for each class.
They should do so by referring to textbooks and other course material.
not specified.
Printed documents are provided for each lecture.
not specified
Achievement is evaluated by the percentage of attendance and presentations.
not specified