X-ray diffraction and electron diffraction are extremely effective methods for conducting structural analysis of crystalline materials. In this course students study kinematic theory and dynamical theory, and learn through exercises the principles and specific techniques of orientation analysis and structural analysis using X-ray diffraction.
By gaining an understanding of the special characteristics of X-ray and electron diffraction, students will learn to carry out material characterization with the most suitable technique.
At the end of this course, students will be able to:
1) Have and understanding of the principles of x-ray and electron diffraction.
2) Explain the differences between x-ray and electron diffraction.
3) Acquire the techniques and skills of materials characterization.
space group, x-ray diffraction, back-reflection Laue method, electron diffraction, diffraction condition, kinematical theory of electron diffraction, dynamical theory of electron diffraction, structure analysis, electron microscope, electron diffraction pattern
|Intercultural skills||Communication skills||✔ Specialist skills||Critical thinking skills||✔ Practical and/or problem-solving skills|
Attendance is taken in every class.
Towards the end of class, students are given exercise problems related to what is taught on that day to solve.
|Course schedule||Required learning|
|Class 1||Symmetry of crystals||The homework must be handed in next class.|
|Class 2||Stereographic projection and orientation relationship|
|Class 3||X-ray diffraction and back-reflection Laue method|
|Class 4||Crystal orientation analysis by x-ray diffraction|
|Class 5||Kinematical theory of electron diffraction|
|Class 6||Laue condition|
|Class 7||Electron diffraction pattern|
|Class 8||Achievement evaluation and general practice (1)|
|Class 9||Dynamical theory of electron diffraction|
|Class 10||Structure analysis by x-ray and electron diffraction methods|
|Class 11||Influence of structural imperfections on the diffraction pattern|
|Class 12||Difference between x-ray diffraction and electron diffraction|
|Class 13||Principles of electron microscope|
|Class 14||Images of electron microscopy|
|Class 15||Achievement evaluation and general practice (2)|
Course materials are provided during class.
B.D. Cullity and S. R. Stock,"Elements of x-ray diffraction", third edition, PrenticeHall, (2001).
L. Reimer, "Transmission electron microscopy", fourth edition, Springer-Verlag, (1997).
B. Fultz and J. M. Howe, "Transmission electron microscopy and diffractometry of materials", second edition, Springer-Verlag, (2002).
Students’ course scores are based on exercise problems and midterm exams (50%) and final exams (50%).
No prerequisites are necessary, but enrollment in the related courses is desirable.