This course provides a comprehensive introduction to a range of microscopy techniques (viz. Optical and electron microscopies). The syllabus includes brief introduction to the structure of crystalline solids, imperfections in solid materials and basic concepts of microscopy. Students will explore the main construction and basic principles of various microscopy techniques, the strengths and weaknesses of each technique, and be better planned of selecting a suitable microscopy technique for their research purpose. Other topics include basics of optical properties, electron-solid interactions, electron diffraction and image formation, and discussion of different techniques of specimen preparations. Electron diffraction analyses and X-ray energy-dispersive spectrometry for microstructure characterization, phase identification and crystallography analyses of a wide spectrum of solid materials. A brief introduction to the very recent development of advanced aberration corrected scanning transmission electron microscopy for imaging and spectrometry at atomic resolution.
By the end of this course, students will be able to:
(a) Understand the basic construction, capabilities and limitations of each microscopic technique.
(b) Understand the different modes of image formation in each microscopic technique for microstructure and crystallographic characterization in solid materials.
Optical and electron microscopies, nanostructure, microstructure, crystallography, properties, solid materials
|✔ 専門力||教養力||✔ コミュニケーション力||展開力(探究力又は設定力)||展開力(実践力又は解決力)|
Assignments will be given during lectures to improve understanding.
|第1回||Introduction||Historical and current developments of microscopy in materials science.|
|第2回||Structure of crystalline solids||Brief introduction to the concepts of lattice, basis, crystal structure systems and streographic projection.|
|第3回||Imperfections in solid materials||Introduction to various types of defects in solid materials|
|第4回||Optical microscopy||Basic structure and principles of optical microscopy, properties of light, image formation, magnification and resolution.|
|第5回||Scanning electron microscopy (SEM)-I:Introduction||Instrumentation, Electron beam-specimen interactions.|
|第6回||Scanning electron microscopy (SEM)-II: Imaging||Image formation based on secondary and backscattered electrons|
|第7回||Scanning electron microscopy (SEM)-III: X-ray microanalysis.||Basic principles, generation of characteristic X-rays. Brielf introduction to Electron Probe Micro Analyzer (EPMA)|
|第8回||Scanning electron microscopy (SEM)-IV: Specimen preparation.||Introduction to various specimen preparation methods for optical microscopy, SEM and EPMA.|
|第9回||Transmission Electron microscopy (TEM)-I: Introduction||Introduction to the different components and their functions of a TEM microscope.|
|第10回||Transmission Electron microscopy (TEM)-II: Electron scattering||Electron diffraction, Bragg’s Law and thinking in reciprocal space.|
|第11回||Transmission Electron microscopy (TEM)-III: Electron scattering-continue||Indexing diffraction pattern and structure factor calculation|
|第12回||Transmission Electron microscopy (TEM)-IV: Imaging based on mass-thickness and diffraction contrasts||Principles of various imaging modes|
|第13回||Transmission Electron microscopy (TEM)-V: Imaging based on phase contrast and Z-contrast||Image formation of lattice fringes. Brief introduction to the high-angle annular dark field (HAADF) imaging by STEM.|
|第14回||Specimen preparation for TEM.||Introduction to various techniques of TEM specimen preparation in solid materials.|
1) William D. Callister, Jr. and David G. Rethwisch, Materials Science and Engineering: An Introduction, (Wiley, 2014, 9th edition)
2) Joseph I. Goldstein, Dale E. Newbury, Patrick Echlin, David C. Joy, Charles Fiori and Eric Lifshin, Scanning Electron Microscopy and X-ray Microanalysis-A Text for Biologists, Materials Scientists and Geologists, (Plenum Press, New York, 1981).
3) David B. Williams and C. Barry Carter, Transmission Electron Microscopy- A Textbook for Materials Science, (Plenum Press, New York, 1996).
1) Nobuo Tanaka, Ed., Scanning Transmission Electron Microscopy of Nanomaterials- Basics of Imaging and Analysis, (Imperial College Press, 2015)
Students are assessed by assignments and final term examination.
Basic level of English, some knowledge of crystallography in solid materials, as well as capability of 3D imagination may be helpful.
Suzukakedai, J2 building, 14th floor, Room 1413 (ext. 5578)