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2017　Microscopic characterization of solid materials 大岡山

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Academic unit or major
Graduate major in Materials Science and Engineering
Instructor(s)
Chai Yaw Wang 
Class Format
Lecture     
Media-enhanced courses
Day/Period(Room No.)
Mon3-4(S8-501)  Thr3-4(S8-501)  
Group
大岡山
Course number
MAT.M419
Credits
2
Academic year
2017
Offered quarter
1Q
Syllabus updated
2017/3/17
Lecture notes updated
-
Language used
English
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Course description and aims

This course provides a comprehensive introduction to a range of microscopy techniques (viz. Optical and electron microscopies). The syllabus includes brief introduction to the structure of crystalline solids, imperfections in solid materials and basic concepts of microscopy. Students will explore the main construction and basic principles of various microscopy techniques, the strengths and weaknesses of each technique, and be better planned of selecting a suitable microscopy technique for their research purpose. Other topics include basics of optical properties, electron-solid interactions, electron diffraction and image formation, and discussion of different techniques of specimen preparations. Electron diffraction analyses and X-ray energy-dispersive spectrometry for microstructure characterization, phase identification and crystallography analyses of a wide spectrum of solid materials. A brief introduction to the very recent development of advanced aberration corrected scanning transmission electron microscopy for imaging and spectrometry at atomic resolution.

Student learning outcomes

By the end of this course, students will be able to:
(a) Understand the basic construction, capabilities and limitations of each microscopic technique.
(b) Understand the different modes of image formation in each microscopic technique for microstructure and crystallographic characterization in solid materials.

Keywords

Optical and electron microscopies, nanostructure, microstructure, crystallography, properties, solid materials

Competencies that will be developed

✔ Specialist skills Intercultural skills ✔ Communication skills Critical thinking skills Practical and/or problem-solving skills

Class flow

Assignments will be given during lectures to improve understanding.

Course schedule/Required learning

  Course schedule Required learning
Class 1 Introduction Historical and current developments of microscopy in materials science.
Class 2 Structure of crystalline solids Brief introduction to the concepts of lattice, basis, crystal structure systems and streographic projection.
Class 3 Imperfections in solid materials Introduction to various types of defects in solid materials
Class 4 Optical microscopy Basic structure and principles of optical microscopy, properties of light, image formation, magnification and resolution.
Class 5 Scanning electron microscopy (SEM)-I:Introduction Instrumentation, Electron beam-specimen interactions.
Class 6 Scanning electron microscopy (SEM)-II: Imaging Image formation based on secondary and backscattered electrons
Class 7 Scanning electron microscopy (SEM)-III: X-ray microanalysis. Basic principles, generation of characteristic X-rays. Brielf introduction to Electron Probe Micro Analyzer (EPMA)
Class 8 Scanning electron microscopy (SEM)-IV: Specimen preparation. Introduction to various specimen preparation methods for optical microscopy, SEM and EPMA.
Class 9 Transmission Electron microscopy (TEM)-I: Introduction Introduction to the different components and their functions of a TEM microscope.
Class 10 Transmission Electron microscopy (TEM)-II: Electron scattering Electron diffraction, Bragg’s Law and thinking in reciprocal space
Class 11 Transmission Electron microscopy (TEM)-III: Electron scattering-continue Indexing diffraction pattern and structure factor calculation
Class 12 Transmission Electron microscopy (TEM)-IV: Imaging based on mass-thickness and diffraction contrasts Principles of various imaging modes
Class 13 Transmission Electron microscopy (TEM)-V: Imaging based on phase contrast and Z-contrast Image formation of lattice fringes. Brief introduction to the high-angle annular dark field (HAADF) imaging by STEM.
Class 14 Specimen preparation for TEM. Introduction to various techniques of TEM specimen preparation in solid materials.
Class 15 Review

Textbook(s)

1) William D. Callister, Jr. and David G. Rethwisch, Materials Science and Engineering: An Introduction, (Wiley, 2014, 9th edition)
2) Joseph I. Goldstein, Dale E. Newbury, Patrick Echlin, David C. Joy, Charles Fiori and Eric Lifshin, Scanning Electron Microscopy and X-ray Microanalysis-A Text for Biologists, Materials Scientists and Geologists, (Plenum Press, New York, 1981).
3) David B. Williams and C. Barry Carter, Transmission Electron Microscopy- A Textbook for Materials Science, (Plenum Press, New York, 1996).

Reference books, course materials, etc.

1) Nobuo Tanaka, Ed., Scanning Transmission Electron Microscopy of Nanomaterials- Basics of Imaging and Analysis, (Imperial College Press, 2015)

Assessment criteria and methods

Students are assessed by assignments and final term examination.

Related courses

  • MAT.M313 ： Introduction to solid materials

Prerequisites (i.e., required knowledge, skills, courses, etc.)

Basic level of English, some knowledge of crystallography in solid materials, as well as capability of 3D imagination may be helpful.

Contact information (e-mail and phone)    Notice : Please replace from "[at]" to "@"(half-width character).

Suzukakedai, J2 building, 14th floor, Room 1413 (ext. 5578)
chai.y.aa[at]m.titech.ac.jp

Office hours

9:00-18:00

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