- 開講元
- 材料コース
- 担当教員名
- CHAI YAW WANG
- 授業形態
- 講義 (Zoom)
- メディア利用科目
- 曜日・時限(講義室)
- 火3-4(S8-501) 金3-4(S8-501)
- クラス
- 大岡山
- 科目コード
- MAT.M419
- 単位数
- 2
- 開講年度
- 2020年度
- 開講クォーター
- 1Q
- シラバス更新日
- 2020年9月18日
- 講義資料更新日
- -
- 使用言語
- 英語
- アクセスランキング
-
media
講義の概要とねらい
This course provides a comprehensive introduction to a range of microscopy techniques (viz. Optical and electron microscopies). The syllabus includes brief introduction to the structure of crystalline solids, imperfections in solid materials and basic concepts of microscopy. Students will explore the main construction and basic principles of various microscopy techniques, the strengths and weaknesses of each technique, and be better planned of selecting a suitable microscopy technique for their research purpose. Other topics include basics of optical properties, electron-solid interactions, electron diffraction and image formation, and discussion of different techniques of specimen preparations. Electron diffraction analyses and X-ray energy-dispersive spectrometry for microstructure characterization, phase identification and crystallography analyses of a wide spectrum of solid materials. A brief introduction to the very recent development of advanced aberration corrected scanning transmission electron microscopy for imaging and spectrometry at atomic resolution.
到達目標
By the end of this course, students will be able to:
(a) Understand the basic construction, capabilities and limitations of each microscopic technique.
(b) Understand the different modes of image formation in each microscopic technique for microstructure and crystallographic characterization in solid materials.
キーワード
Optical and electron microscopy techniques, nanostructure, microstructure, crystallography, properties, solid materials
学生が身につける力(ディグリー・ポリシー)
| ✔ 専門力 | 教養力 | ✔ コミュニケーション力 | ✔ 展開力(探究力又は設定力) | ✔ 展開力(実践力又は解決力) |
授業の進め方
Assignments and quizzes will be given during lectures to improve understanding. Final examination will be given at the end of the course.
授業計画・課題
| 授業計画 | 課題 | |
|---|---|---|
| 第1回 | Introduction | Historical and current developments of microscopy in materials science. |
| 第2回 | Structure of crystalline solids | Brief introduction to the concepts of lattice, basis, crystal structure systems and streographic projection. |
| 第3回 | Imperfections in solid materials | Introduction to various types of defects in solid materials |
| 第4回 | Optical microscopy | Basic structure and principles of optical microscopy, properties of light, image formation, magnification and resolution. |
| 第5回 | Scanning electron microscopy (SEM)-I:Introduction and Imaging | Instrumentation, electron beam-specimen interactions, concepts of resolution and depth of field and image formation based on secondary and backscattered electrons |
| 第6回 | Scanning electron microscopy (SEM)-II: Lens Aberrations and X-ray microanalysis. | Descriptions of various lens aberrations, generation of characteristic X-rays and a brief introduction to Electron Probe Micro Analyzer (EPMA) |
| 第7回 | Scanning electron microscopy (SEM)-III: Specimen preparation | Introduction to various specimen preparation methods for optical microscopy, SEM and EPMA. Microstructure analyses by Image J software. |
| 第8回 | Transmission Electron microscopy (TEM)-I: Introduction | Introduction to the different components and their functions of a TEM microscope. |
| 第9回 | Transmission Electron microscopy (TEM)-II: Electron scattering and electron diffraction | Electron diffraction, Bragg’s Law and thinking in reciprocal space, indexing diffraction pattern and structure factor calculation. |
| 第10回 | Transmission Electron microscopy (TEM)-III: Electron scattering-continue | Ewald Sphere, bight field and dark field imaging, microstructure and electron diffraction pattern analyses. |
| 第11回 | Transmission Electron microscopy (TEM)-IV: Imaging: mass-thickness contrast and diffraction contrast | Principles of various imaging modes, two-beam condition imaging and defects characterizations |
| 第12回 | Transmission Electron microscopy (TEM)-V: Imaging: mass-thickness contrast and diffraction contrast-continue | Descriptions of the formation of thickness fringes and bend contours. |
| 第13回 | Transmission Electron microscopy (TEM)-VI: Imaging: phase contrast and Z-contrast | Image formation of lattice and moire fringes, and a brief introduction to the high-angle annular dark field (HAADF) imaging by STEM. |
| 第14回 | Transmission Electron microscopy (TEM)-VII: Specimen preparation | Introduction to various techniques of TEM specimen preparation in solid materials. |
授業時間外学修（予習・復習等）
学修効果を上げるため，教科書や配布資料等の該当箇所を参照し，「毎授業」授業内容に関する予習と復習（課題含む）をそれぞれ概ね100分を目安に行うこと。
教科書
1) William D. Callister, Jr. and David G. Rethwisch, Materials Science and Engineering: An Introduction, (Wiley, 2014, 9th edition)
2) Joseph I. Goldstein, Dale E. Newbury, Patrick Echlin, David C. Joy, Charles Fiori and Eric Lifshin, Scanning Electron Microscopy and X-ray Microanalysis-A Text for Biologists, Materials Scientists and Geologists, (Plenum Press, New York, 1981).
3) David B. Williams and C. Barry Carter, Transmission Electron Microscopy- A Textbook for Materials Science, (Plenum Press, New York, 1996).
参考書、講義資料等
1) Nobuo Tanaka, Ed., Scanning Transmission Electron Microscopy of Nanomaterials- Basics of Imaging and Analysis, (Imperial College Press, 2015)
成績評価の基準及び方法
Students are assessed by quizzes, assignments and final examination.
関連する科目
- MAT.M313 ： 材料科学入門
履修の条件(知識・技能・履修済科目等)
Sufficient level of English and some knowledge of crystallography in solid materials are necessary. Students with the ability to imagine 3D structure may be helpful.
連絡先（メール、電話番号） ※”[at]”を”@”(半角)に変換してください。
Suzukakedai, J2 building, 14th floor, Room 1413 (ext. 5578)
chai.y.aa[at]m.titech.ac.jp
オフィスアワー
9:00-18:00
