X-ray diffraction and electron diffraction are extremely effective methods for conducting structural analysis of crystalline materials. In this course students study kinematic theory and learn through exercises the principles and specific techniques of orientation analysis and structural analysis using X-ray diffraction.
By gaining an understanding of the special characteristics of X-ray and electron diffraction, students will learn to carry out material characterization with the most suitable technique.
At the end of this course, students will be able to:
1) Have and understanding of the principles of x-ray and electron diffraction.
2) Explain the differences between x-ray and electron diffraction.
3) Acquire the techniques and skills of materials characterization.
space group, x-ray diffraction, back-reflection Laue method, electron diffraction, diffraction condition, kinematical theory of electron diffraction, electron microscope, electron diffraction pattern
✔ Specialist skills | Intercultural skills | Communication skills | Critical thinking skills | ✔ Practical and/or problem-solving skills |
Towards the end of class, students are given exercise problems related to what is taught on that day to solve.
Course schedule | Required learning | |
---|---|---|
Class 1 | Symmetry of crystals | Learn the space group of lattice |
Class 2 | Stereographic projection and orientation relationship | Learn the stereographic projection and draw the orientation relationship between two crystals |
Class 3 | X-ray diffraction and back-reflection Laue method | Learn the back-reflection Laue method |
Class 4 | Crystal orientation analysis by x-ray diffraction | Learn the orientation analysis by the back-reflection Laue method |
Class 5 | Kinematical theory of electron diffraction | Learn the kinematical theory of electron diffraction |
Class 6 | Laue condition | Learn the Laue diffraction condition and the reciprocal lattice |
Class 7 | Electron diffraction pattern | Draw the electron diffraction pattern |
To enhance effective learning, students are encouraged to spend approximately 100 minutes preparing for class and another 100 minutes reviewing class content afterwards (including assignments) for each class.
They should do so by referring to textbooks and other course material.
Course materials are provided during class.
B.D. Cullity and S. R. Stock,"Elements of x-ray diffraction", third edition, PrenticeHall, (2001).
L. Reimer, "Transmission electron microscopy", fourth edition, Springer-Verlag, (1997).
B. Fultz and J. M. Howe, "Transmission electron microscopy and diffractometry of materials", second edition, Springer-Verlag, (2002).
Students’ course scores are based on exercise problems.
No prerequisites are necessary, but enrollment in the related courses is desirable.