- 使用教室
- 火5-6(G114)
- 単位数
- 講義：2 演習：0 実験：0
- 講義コード
- 95039
- シラバス更新日
- 2014年4月15日
- 講義資料更新日
- 2014年3月18日
- 学期
- 前期
講義概要
To be announced
講義の目的
Understanding of fundamentals of surface physics and chemistry
講義計画
1.Introduction of Nanotechnology and Nanoscience
2.Scanning Probe Microscopy and Spectroscopy
1.History of Scanning Probe Microscopy (SPM) : from Observation to Manipulation
2.Scanning Tunneling Microscopy (STM) 1 : Surface Chemistry and Phase Transitions
3.Scanning Tunneling Microscopy (STM) 2 : Self-Assembled Monolayers (SAM)
4.Atomic Force Microscopy (AFM) 1 : Biological Macromolecules and Surface Forces
5.Atomic Force Microscopy (AFM) 2 : Single Molecular Detection (SMD)
6.Scanning Near-Field Optical Microscopy (SNOM) and Other Probe Methods : Fluorescence Decay Process, Proximity Effect and Further Possibilities
3.Characterization of Organic Thin Films
1.Surface Plasmon Resonance (SPR) Spectroscopy and Ellipsometry
2.X-ray Photoelectron Spectroscopy (XPS)
3.Fourier Transform Infrared Spectroscopy (FTIRS)
4.Dynamic Contact Angles : Surface Free Energy
5.How to Characterize Molecular Orientation in Organic Thin Films
教科書・参考書等
Please download the lecture note.
関連科目・履修の条件等
TBA
成績評価
attendance and report
