- 担当教員
- 原 正彦
- 使用教室
- 木5-6(G115)
- 単位数
- 講義：2 演習：0 実験：0
- 講義コード
- 95039
- シラバス更新日
- 2010年3月22日
- 講義資料更新日
- 2010年3月22日
- 学期
- 前期
講義概要
1.ナノテクノロジーとナノサイエンスの概要
2.走査型プローブ顕微鏡とスペクトロスコピー
2-1．走査型プローブ顕微鏡の歴史：観るから操るへ
2-2．走査型トンネル顕微鏡１：表面化学と相転移
2-3．走査型トンネル顕微鏡２：自己組織化単分子膜
2-4．原子間力顕微鏡１：生体マクロ分子と表面力計測
2-5．原子間力顕微鏡２：単一分子計測
2-6．近接場光学顕微鏡とその他のプローブ手法：蛍光寿命過程，プロキシミティ効果
3.ナノテクノロジーの限界と21世紀の新しい科学技術展望
1.Introduction of Nanotechnology and Nanoscience
2.Scanning Probe Microscopy and Spectroscopy
2-1．History of Scanning Probe Microscopy (SPM): from Observation to Manipulation
2-2．Scanning Tunneling Microscopy (STM) 1: Surface Chemistry and Phase Transitions
2-3．Scanning Tunneling Microscopy (STM) 2: Self-Assembled Monolayers (SAMs)
2-4．Atomic Force Microscopy (AFM) 1: Biological Macromolecules and Surface Forces
2-5．Atomic Force Microscopy (AFM) 2: Single Molecular Detection (SMD)
2-6．Scanning Near-Field Optical Microscopy (SNOM) and Other Probe Methods: Fluorescence Decay Process, and Proximity Effect
3.Limits of Nanotechnology and Paradigm Shift for 21C’s Science and Technology
講義計画
1.Introduction of Nanotechnology and Nanoscience
2.Scanning Probe Microscopy and Spectroscopy
1.History of Scanning Probe Microscopy (SPM) : from Observation to Manipulation
2.Scanning Tunneling Microscopy (STM) 1 : Surface Chemistry and Phase Transitions
3.Scanning Tunneling Microscopy (STM) 2 : Self-Assembled Monolayers (SAM)
4.Atomic Force Microscopy (AFM) 1 : Biological Macromolecules and Surface Forces
5.Atomic Force Microscopy (AFM) 2 : Single Molecular Detection (SMD)
6.Scanning Near-Field Optical Microscopy (SNOM) and Other Probe Methods : Fluorescence Decay Process, Proximity Effect and Further Possibilities
3.Characterization of Organic Thin Films
1.Surface Plasmon Resonance (SPR) Spectroscopy and Ellipsometry
2.X-ray Photoelectron Spectroscopy (XPS)
3.Fourier Transform Infrared Spectroscopy (FTIRS)
4.Dynamic Contact Angles : Surface Free Energy
5.How to Characterize Molecular Orientation in Organic Thin Films
